Instrument Features:
- High resolution and high intensity:
e.g.: Si(220)
reflection, recorded with CuK-Alpha 1 radiation (15.05981 nm):
FWHM=0.075 deg (2-Theta), peak intensity 17000 cts, measuring time 30
sec/step
- Novel setup (picture, 26kB) :
computer controlled adjustment in transmission or reflection geometry
- Data recording:
Two counters or film record the diffraction
pattern, Monitor counter records the monochromatic primary beam
- Novel monochromator (picture, 43 kB)
housing for Ge(111)
- Closed Cycle cryostat (picture, 44 kB)
with removable sample holder
(picture, 42 kB) equipped with furnace for continuous work from
10 to 450 K
- Spinning sample at all temperatures within a He atmosphere to
improve thermal contact at low temperatures
Best suited for measurements of:
- Intensities at variable temperatures
- Thermal dependence of lattice constants
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Poster as pdf-file (2.5MB). |