PPT Slide

Rietveld ESD on Unit cell parameter vs the standard deviation from multiple packings and measurements

• Rietveld ESD on the “a” unit-cell parameter: 0.00007

• Standard Deviation on the “a” unit-cell parameter: 0.00023

• Standard deviation from multiple measurements is over 3 times the estimated standard deviation (ESD) from a single measurement

• The IUCr (International Union of Crystallography) has defined various units including “standard uncertainties” but common nomenclature is being used here.

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