Crystallography Laboratory University of Nijmegen

DIFFRAC^plus X-Ray Diffraction Software

DIFFRAC^plus is AXS's new high-performance software for X-ray powder diffraction. Versatile and easy-to-use data collection, combined with powerful evaluation routines, make every analytical challenge an easy task. DIFFRAC^plus operates under Windows NT™ and Windows 95™, offering all the benefits of the Windows™ environment from fast point-and-click operation to real multitasking. Imagine — control of two diffractometers and data evaluation with several programs can be performed at the same time on one PC!

Data and graphics from DIFFRAC^plus can easily be imported by other Windows™-based applications, such as word processors, databases, and spreadsheets to create state-of-the-art compound documents.

The unique DIFFRAC^plus qualitative phase analysis on background-subtracted raw data accounts for all the information obtained by the measurement, such as peak widths, peak asymmetries, shoulders on peaks, and peaks with very low intensity. This allows very powerful analysis of complicated multiphase mixtures with overlapping lines, as well as analysis of phases with low concentration. Because your time is valuable, the entire PDF database is searched in seconds.

Search parameters are user-specified, and include chemical elements. Potential matches can be overlaid directly with the measured diffractogram for easy evaluation.

The DIFFRAC^plus Immediate Measurement Program allows on-line selection of all control parameters directly onscreen. Editing a measurement parameter program is unnecessary — just click and start. The measurements are consecutively repeated to improve counting statistics by summation of the results.

The DIFFRAC^plus Standard Measurement Program lets you easily edit measurement parameters in clearly organized parameter menus. This program allows simple input of standard measurement conditions, as well as sophisticated measurement strategies with special scan types and data collection loops.

Several samples can be measured in a job with different measurement programs. The status of the samples in the job is displayed. Data processing (for example, background subtraction, phase search, or profile fitting) can be performed automatically after measurement. While the measurement is running, data are displayed continuously onscreen along with the most important measurement parameters. A pseudo-goniometer onscreen represents movement of the goniometer. If a sample magazine is attached, the status of the various samples in the job is also displayed.

Programs available in Nijmegen

Basic package

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