Crystallography Laboratory University of Nijmegen
Accessories
  
Primary beam optics
Short spacer for optics
Long spacer for optics
2 degrees soller slit
Four-bounce monochromator
Automatic divergence slit assembly
Fixed divergence slit assembly
Holder for pinholes and rectangular slits (3x)
0.5 mm pinhole for 435 and 500 mm measuring circle (3x)
1.0 mm pinhole for 435 and 500 mm measuring circle (3x)
0.5 mm pinhole for 600 mm measuring circle (3x)
Fixed divergence slits 0.05 mm, 0.2 mm, 0.6 mm, 1 mm and 2 mm (2x)
Ni filter for Cu-Kbeta radiation (2x)
Height limiting slit: 10 mm height, 2 mm width
 
Sample stages
Standard sample stage
Sample rotation device
1/4-circle Eulerian Cradle
Alignment tool for open Eulerian Cradle
Vacuum intake 5" (rotable)
Powder stage for Eulerian Cradle
Capillary sample holder
Microscope adapter
Separate alignment microscope
Powder sample holder for rotation device
Powder sample holder for Eulerian Cradle (..x)
Knife-edge collimator
 
Secundary beam optics
Long spacer for optics
Variable antiscatter slit assembly, type 2
Fixed anti scatter slits
Focussing monochromator for transmission measurements
Ni filter for Cu-Kbeta radiation
Fixed detector slits 0.05 mm, 0.2 mm, 0.6 mm, 1 mm and 2 mm
Absorber assembly
Spacer for detector
Dynamic scintillation detector, NaI